2.5.1 Advanced Spectroscopy
Understanding the electrical, optical and structural properties will unlock fundamental fingerprints of new materials. This will involve developing and harness key spectroscopic tools that are:
• Light-based (Photoluminescence (PL), time resolved PL, Raman, reflection and absorption spectroscopy): bandgap, absorption, parasitic losses, recombination, minority carrier traps.
• Electron beam-based (UV and X-Ray photoelectron and energy dispersive X-Ray spectroscopy (UPS, XPS and EDS)): composition, energy levels, work functions.
• X-ray and neutron scattering to determine films densities and interface structures.