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New Infrared-Variable Angle Spectroscopic Ellipsometer installed at UNSW


UNSW's ACAP node has recently installed an IR-VASE Mark II (Infrared-Variable Angle Spectroscopic Ellipsometer) at the Sydney campus, bringing new capability to ACAP by extending our current characterisation of photovoltaics materials in the infra-red. The infrared properties of PV materials are critical for determining the operating temperature of a PV module, as well as understanding the electronic structure of PV materials.

The IR ellipsometer combines the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. It covers the wide spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). It can be used to characterize the optical properties of both thin films (ultra-thin films and multilayer films) and bulk materials at temperatures ranging from -70degC to +600degC, which is critical for thermal studies of solar cell technologies.

For collaboration enquiries, please contact team lead Dr Jessica Yajie Jiang:


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